Quick Turn-Around
Scanning Electron Microscope (SEM)
Analysis Service
Fil-Tech, Inc. now offers reasonably priced and quick turn-around SEM analysis for
examining and investigating surface morphology of thin and thick film coatings. SEM imaging is
a useful tool for examining atomistic film growth, substrate surface conditions, quality control,
and failure analysis of coatings. Magnification ranges up to 100,000X (maximum magnification
depends upon the sample).
The SEM images below show evaporatant splatter (images 1 & 2) and a fingerprint
(image 3)
on the surface of a crystal. Evaporant splatter and fingerprints can result in erratic (positive
and/or negative) rate changes and even crystal failure.
The SEM image below is magnified 2,000x, and shows the above evaporatant splatter on the
surface of the crystal:
The SEM image below shows a fingerprint on the surface of a crystal:
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